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archives: Volume 23, Number 4

July 2006

Journal of the Chinese Institute of Industrial Engineers.

ISSN 1017-0669

Vol.23 No.4

1.
The Neural Nwtwork Implementation in Pattern Recohnition of Semiconductor Etching Process
Wen-Chin Chen, Chen-Tai Chen, Chih-Hung Tsai and Tsung-Hsuan Ho pp.269-279
Abstract
2.
Dynamic Multi-Response Experiments by Backpropagation Networks and Desirability Functions
Hsu-Hwa Chang pp.280-288
Abstract
3.
Optimizing Joint Maintenance and Stock Provisioning Policy for a Multi-Echelon Spare Part Logistics Network
Mu-Chen Chen, Chih-Ming Hsu and Shih-Wei Chen pp.289-302
Abstract
4.
Bayesian Theory with Application to Customer Segment and Consuming Behavior Control for Online Business
Shu-chuan Lo pp.303-310
Abstract
5.
Improving the Plastic Ball Grid Array Assembly Yield: a Case Study
Y. H. Hung and M. L. Huang pp.311-318
Abstract
6.
Estimation of The Starting Time of a Step Change Disturbance in a Gamma Process
Yuehjen E. Shao and Chia-Ding Hou pp.319-327
Abstract
7.
Probabilistic Models for Software Quality Analysis
Cheng-Tzu Wang, Chih-Chung Lo and Tien-Fu Jean pp.328-336
Abstract
8.
The Model for the Modified Minimal Repair/Replacement Problems with New Types of Replacement
Mingchih Chen and Chun-Yuan Cheng pp.337-344
Abstract
9.
VPRS Model for Mobile Phone Test Procedure
Jyh-Hwa Hsu, Tai-Lin Chiang and Huei-Chun Wang pp.345-355
Abstract