Back issues
archives: Volume 21, Number 4
July 2004
Journal of the Chinese Institute of Industrial Engineers.
ISSN 1017-0669
Vol.21 No.4
| 1.
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Constructing Semiconductor Manufacturing Performance Indexes and Applying Data Mining for Manufacturing Data Analysis
| Chen-Fu Chien, Allen Hsiao and Ivan Wang pp.313-327 |
| Abstract |
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| 2.
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A Data Clustering Model for Wafer Yield Loss in Semiconductor Manufacturing
| Shu-Fan Liu and Fei-Long Chen pp.328-338 |
| Abstract |
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| 3.
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The Placement Yield Analysis for IC Components in the X─Y Plane and Z Direction
| Chien-Yi Huang and Jr-Jie Shie pp.339-348 |
| Abstract |
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| 4.
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A Study on Identifying the Time of a Step Change Disturbance with S Control Charts and MLE Method
| Yuehjen E. Shao and Chia-Ding Hou pp.349-357 |
| Abstract |
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| 5.
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An Investigation of the Hybrid Forecasting Models for Stock Price Variation in Taiwan
| Pei-Chann Chang, Yen-Wen Wang and Wen-Ning Yang pp.358-368 |
| Abstract |
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| 6.
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A Company Performance Measurement by ROIC and DEA─An Example of Taiwan IC Design House
| Chih-Chien Hu and Han-Lin Li pp.369-383 |
| Abstract |
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| 7.
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A Study of Inventory Model Based on Order Quantity and Lead Time as Decision Variables─Demand Frequency and Quantities Corresponding Poisson and Normal Distribution
| Yen-Fang Chu and Wei-Chin Lin pp.384-394 |
| Abstract |
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| 8.
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E─Design Collaborative Reference Model for OEM Product Development
| Ming-Kuen Chen and Yi-Ching Liao pp.395-408 |
| Abstract |
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| 9.
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Study of Dynamic X-Ray Image Enhancement and Defects Classification
| Bernard C. Jiang, Ke-Dong Liao, Shu-Hui Lee, Chien-Chih Wang, Zi-Ren Chang and Yong-Xian Liu pp.409-421 |
| Abstract |
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